Eclipse™ test handler delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -55°C to +155°C*, with throughput up to 12,000 UPH.
Unique Inspection Options
- Aquilae HR Sidewall: Micro-scale visible defect inspection down to 5 µm
- Aquilae Infrared: Inner cracks detection on silicon devices
- 3D Flex® Vision: True 3D inspection for Balls/Bumps
- ViewMap
Available Options
- Tri-temp -55°C to +155°C (chamber-less, soak on head)*
- Auto Retest
- DTM (Contactor Conditioning)
- DUT Rotation
- Liquid and Mechanical TIM
- Manual RFID
- 207 kgf socket force
- 500 kgf contactor motor force
- Air-Cooled and Water-Cooled Chillers to -70°C
- Thermal (heated) CDP
*for temperatures beyond this range please consult factory
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